G00500 - SEMI G5 - Standard for Ceramic Chip Carriers Revision:SEMI G5-87 - Inactive The design of individual manual

The design of individual manual handles is open to be accomplished within the dimensional limitations of the Standard

SEMI E6-0914 (technical revision)

3  This Test Method can be used for silicon in which the boron contamination is greater than two times the SIMS detection limits that is approximately between 5 × 1012 atoms/cm3 and 5 × 1013 atoms/cm3 depending upon the instrumentation type

SEMI半導体製造装置通信スタンダード2（SECS-II）は，インテリジェント装置とホスト間で交換するメッセージの解釈について詳細に定義している。本仕様は，日本電子工業振興協会（JEIDA）の第12委員会の協力により規定された。

G00500 - SEMI G5 - Standard for Ceramic Chip Carriers Revision:SEMI G5-87 - Inactive The design of individual manualNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This Specification defines the acceptance criteria for co fired, ceramic chip carriers both leaded and lead less. Referenced SEMI Standards (purchase separately) SEMI G8 Test Method for Gold Plating Quality SEMI G25 Test