Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Bulb reflector infra-red lamps

Bulb reflector infra-red lamps

TCP-UDP/IP based communication profile has been defined

This part of ISO/TR 10064 applies to bevel gear components as defined in ISO 17485

Components and parts used in such systems should be clean prior to assembly

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Bulb reflector infra-red lamps1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.