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Ge Wafer Undoped (110) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm Battery Cell Tester Conductor type: N-type
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Ge Wafer Undoped (110) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm Battery Cell Tester Conductor type: N-type
$215.62
Description
Conductor type: N-type
82 Emission wavelength (nm ) 540 410 418 450 / 420 470/540 480 550 Decay constant(ns ) 900 230 0
and power cable included
Application To seal the cylinder cell
Ge Wafer Undoped (110) 3" dia x 0.5 mm 2 side polished resistivity: >50 ohm-cm Battery Cell Tester Conductor type: N-typeGe Wafer Specification Growing Method: CZ Orientation: (110) + 0. 7 Deg. Wafer Size: 3" dia x 0. 5 mm Surface Polishing: two sides optical polished Surface finish (RMS or Ra) : < 30A Doping: Undoped Conductor type: N type Resistivity: >50 Ohms cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Package: under 1000 class clean room in wafer container Related Product Other
Shipping Notes
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- Standard Shipping : 3-10 business days
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