Name: VGRP-UM
Brand: martinafruit.com
SKU: 47982699382
Price: 942.50 USD
Availability: InStock
Rating: 4.1251 (5 reviews)

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Description

VGRP-UMCalibration artifact: 180nm step height, 10m pitch DESCRIPTION Calibration artifact, 180nm step height, 10m pitch. This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST. Replaces model STR10 1800P.

Aspect ratio of 15:1 at 6um from tip apex

-- Set of one (1) spare boot and five (5) vent tubes

Requires specialized probe holder model VITA-CH-MM

They deliver extreme imaging speed without loss of resolution

5 Back Angle: 1 ± 0

The MESP-RC-V2 has a nominal coercivity of 400 Oe (medium)

-- Made of Teflon for maximum solvent compatibility

For the highest resolution nanoelectrical measurements with outstanding wear resistance

Tip Geometry: Standard (Steep) Tip Height: 3 - 6 Tip Radius (Nom): <30

- Electrical characterization with PeakForce TUNA

ScanAsyst probes have less than 2deg of cantilever bend

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2