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Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using an accelerometer Ingestion-build-103253 including grouts

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including grouts

BS EN 10246-5

BS EN 60749-9 provides users guidance on solvent test

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Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using an accelerometer Ingestion-build-103253 including grouts1 Scope and object This part of IEC 60749 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface

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