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Semiconductor devices. Mechanical and climatic test methods - Neutron beam irradiated single event effect (SEE) test method for semiconductor devices Ingestion-build-63114 BS 5666-2 describes the preliminary

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BS 5666-2 describes the preliminary inspection that includes visual examination

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Semiconductor devices. Mechanical and climatic test methods - Neutron beam irradiated single event effect (SEE) test method for semiconductor devices Ingestion-build-63114 BS 5666-2 describes the preliminary

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