Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-61878 It specifies the mechanical and

It specifies the mechanical and physical properties of bolts

Who is BS EN 61076-2-001 - Uniform specifications for connectors for

Determination of thickness and flatness

subcontractors and students

Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-61878 It specifies the mechanical and1 Scope and object This part of IEC 60749 covers the I test and the overvoltage latch up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to establish a method for determining integrated circuit (IC) latch up characteristics and to define latch up failure criteria. Latch up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress"