HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate Revision:SEMI HB14-0223 - Current SEMI D6-92 (first published)

SEMI D6-92 (first published)

There are more and more applications of color electronic paper displays on the market nowadays

The user should investigate metrology suppliers’ current capabilities

SEMI MF28 — Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate Revision:SEMI HB14-0223 - Current SEMI D6-92 (first published)Because there are various requirements and measurement methods for patterned sapphire substrate (PSS) in the LED industry, a standardized measurement method of PSS needs to be established so that customers and PSS suppliers can work together smoothly. It is necessary to establish a standardized measurement method of PSS so that PSS suppliers will be able to provide clear and consistent product information to customers. Provides a measurement method