Home
»
»
G08600 - SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法 Revision:SEMI G86-0303 - Superseded identification
G08600 - SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法 Revision:SEMI G86-0303 - Superseded identification
$115.50
Description
identification
This Test Method is applicable to slices of silicon with resistivity higher than 3 ·cm for p-type and higher than 1 ·cm for n-type
orgで入手可能となる。初版は2003年11月発行。
• A model of the behavior to be exhibited by semiconductor manufacturing equipment in a SECS-II communication environment
G08600 - SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法 Revision:SEMI G86-0303 - Superseded identificationGlobal Assembly and Packaging CommitteeJapanese Packaging Committee2003 110Japanese Regional Standards Committee20031 www. semi. org20033 Referenced SEMI Standards None.
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.
